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A L Blum; J S Swirhun; R A Sinton; F Yan; S Herasimenka; T Roth; K Lauer; J Haunschild; B Lim; K Bothe; Z Hameiri; B Seipel; R Xiong; M Dhamrin; J D Murphy

Inter-laboratory study of eddy-current measurement of excess carrier recombination lifetime Artikel

In: IEEE Journal of Photovoltaics, Bd. 4, Nr. 1, S. 525-531, 2014.

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2.

A L Blum; J S Swirhun; R A Sinton; F Yan; S Herasimenka; T Roth; K Lauer; J Haunschild; B Lim; K Bothe; Z Hameiri; B Seipel; R Xiong; M Dhamrin; J D Murphy

Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime Proceedings Article

In: IEEE, (Hrsg.): 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), S. 1396-1401, Tampa, FL, USA, 2013, ISBN: 978-1-4799-3299-3.

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