Veröffentlichungen
2016 |
C. Kranz, B. Wolpensinger, R. Brendel, and T. Dullweber Analysis of local aluminum rear contacts of bifacial PERC+ solar cells Artikel IEEE Journal of Photovoltaics 6 (4), 830, (2016). Abstract | Links | BibTeX | Schlagwörter: Aluminum, Analytical models, Bifacial passivated emitter rear contact (PERC) solar cells, contact formation, Photovoltaic cells, Printing, Scanning electron microscopy, screen-printing, silicon, Solids @article{Kranz2016b,
title = {Analysis of local aluminum rear contacts of bifacial PERC+ solar cells}, author = {C Kranz and B Wolpensinger and R Brendel and T Dullweber}, doi = {10.1109/JPHOTOV.2016.2551465}, year = {2016}, date = {2016-07-01}, journal = {IEEE Journal of Photovoltaics}, volume = {6}, number = {4}, pages = {830}, abstract = {A recently published industrial passivated emitter rear contact (PERC) solar cell concept called PERC+ enables bifacial applications by printing an aluminum (Al) finger grid instead of the full-area Al layer aligned to the laser contact openings on the rear side. We demonstrate that the rear contacts of these PERC+ solar cells exhibit back-surface field (BSF) depths of around 6 μm over a large range of contact linewidths, whereas PERC cells with full-area Al rear layer show a reduction of the Al-BSF depths for narrower contact lines. Using an existing analytical model for the local contact formation, we show that the measured Al-BSF depths are well described solely by the different volume of Al paste printed on the rear side. Consequently, the open-circuit voltage of PERC+ solar cells improves by up to 5 mV when reducing the contact linewidth only. In contrast, for PERC cells with full-area Al layer, the Voc slightly decreases with narrower contact linewidths due to the thinner Al-BSF depths. We observe a strongly reduced number of voids in the Al-Si eutectic layer for PERC+ cells, compared with PERC. As physical root cause for void formation, we propose the minimization of surface energy of the Al-Si melt.}, keywords = {Aluminum, Analytical models, Bifacial passivated emitter rear contact (PERC) solar cells, contact formation, Photovoltaic cells, Printing, Scanning electron microscopy, screen-printing, silicon, Solids}, pubstate = {published}, tppubtype = {article} } A recently published industrial passivated emitter rear contact (PERC) solar cell concept called PERC+ enables bifacial applications by printing an aluminum (Al) finger grid instead of the full-area Al layer aligned to the laser contact openings on the rear side. We demonstrate that the rear contacts of these PERC+ solar cells exhibit back-surface field (BSF) depths of around 6 μm over a large range of contact linewidths, whereas PERC cells with full-area Al rear layer show a reduction of the Al-BSF depths for narrower contact lines. Using an existing analytical model for the local contact formation, we show that the measured Al-BSF depths are well described solely by the different volume of Al paste printed on the rear side. Consequently, the open-circuit voltage of PERC+ solar cells improves by up to 5 mV when reducing the contact linewidth only. In contrast, for PERC cells with full-area Al layer, the Voc slightly decreases with narrower contact linewidths due to the thinner Al-BSF depths. We observe a strongly reduced number of voids in the Al-Si eutectic layer for PERC+ cells, compared with PERC. As physical root cause for void formation, we propose the minimization of surface energy of the Al-Si melt.
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