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2016

J. Käsewieter, F. Haase, and M. Köntges

Model of cracked solar cell metallization leading to permanent module power loss Artikel

IEEE Journal of Photovoltaics 6 (1), 28, (2016).

Abstract | Links | BibTeX | Schlagwörter: Bridge circuits, Cell metallization, crack degradation, Electrical resistance measurement, Fatigue, fatigue model, metallization, photovoltaic (PV) module, Photovoltaic cells, power loss, Resistance, silicon

2015

H. Mäckel, and P. P. Altermatt

Current Transport Through Lead-Borosilicate Interfacial Glass Layers at the Screen-Printed Silver-Silicon Front Contact Artikel

IEEE Journal of Photovoltaics 5 (4), 1034-1046, (2015), ISSN: 2156-3381.

Links | BibTeX | Schlagwörter: Conductivity, Contact resistance, Electrical resistance measurement, Glass, Lead, silicon, Silicon solar cell, Silver, solar cell metallization, Tunneling

2014

A. L. Blum, J. S. Swirhun, R. A. Sinton, F. Yan, S. Herasimenka, T. Roth, K. Lauer, J. Haunschild, B. Lim, K. Bothe, Z. Hameiri, B. Seipel, R. Xiong, M. Dhamrin, and J. D. Murphy

Inter-laboratory study of eddy-current measurement of excess carrier recombination lifetime Artikel

IEEE Journal of Photovoltaics 4 (1), 525-531, (2014).

Links | BibTeX | Schlagwörter: Atmospheric measurements, charge carrier lifetime, eddy currents, Electrical resistance measurement, Instruments, Laboratories, Particle measurements, photoconductivity, silicon, Standards, Transient analysis

2013

A. L. Blum, J. S. Swirhun, R. A. Sinton, F. Yan, S. Herasimenka, T. Roth, K. Lauer, J. Haunschild, B. Lim, K. Bothe, Z. Hameiri, B. Seipel, R. Xiong, M. Dhamrin, and J. D. Murphy

Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime Inproceedings

IEEE (Hrsg.): 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) , 1396-1401, Tampa, FL, USA, (2013), ISBN: 978-1-4799-3299-3.

Links | BibTeX | Schlagwörter: Atmospheric measurements, charge carrier lifetime, eddy currents, Electrical resistance measurement, Instruments, Laboratories, Particle measurements, photoconductivity, silicon, Standards, Transient analysis

H. Schulte-Huxel, S. Blankemeyer, R. Bock, A. Merkle, S. Kajari-Schröder, and R. Brendel

Al-Foil on Encapsulant for the Interconnection of Al-Metalized Silicon Solar Cells Artikel

IEEE Journal of Photovoltaics 3 (1), 77-82, (2013).

Links | BibTeX | Schlagwörter: Al-metallization, Back-contact solar cells, Electrical resistance measurement, Glass, Lamination, Laser microwelding, Lasers, Lead-free, Measurement by laser beam, module-level inter-connection, Photovoltaic cells, photovoltaic module, Welding

2012

S. Eidelloth, F. Haase, and R. Brendel

Simulation tool for equivalent circuit modeling of photovoltaic devices Artikel

IEEE Journal of Photovoltaics 2 (4), 572-579, (2012).

Links | BibTeX | Schlagwörter: Electrical resistance measurement, Equivalent circuits, Integrated circuit modeling, Photovoltaic cells, Resistance, Simulation, simulation program with integrated circuit emphasis (SPICE), SPICE

C. Schinke, F. Kiefer, M. Offer, D. Hinken, A. Schmidt, N. P. Harder, R. Bock, T. Brendemühl, J. Schmidt, K. Bothe, and R. Brendel

Contacting interdigitated back-contact solar cells with four busbars for precise current-voltage measurements under standard testing conditions Artikel

IEEE Journal of Photovoltaics 2 (3), 247-255, (2012).

Links | BibTeX | Schlagwörter: Current measurement, current–voltage characteristics, Electrical resistance measurement, Fill Factor, Integrated circuit modeling, interdigitated back-contact (IBC) solar cell, Photovoltaic cells, Pins, Resistance, Voltage measurement

2011

S. Gatz, T. Dullweber, and R. Brendel

Evaluation of Series Resistance Losses in Screen-Printed Solar Cells With Local Rear Contacts Artikel

IEEE Journal of Photovoltaics 1 (1), 37-42, (2011), ISSN: 2156-3381.

Links | BibTeX | Schlagwörter: Conductivity, Electrical resistance measurement, metallization, passivation, Photovoltaic cells, photovoltaics, Resistance, silicon, Solar Cells

F. Haase, S. Eidelloth, R. Horbelt, K. Bothe, E. G. Rojas, and R. Brendel

Loss analysis of back-contact back-junction thin-film monocrystalline silicon solar cells Inproceedings

IEEE (Hrsg.): 2011 37th IEEE Photovoltaic Specialists Conference, 002874-002877, Seattle, WA, USA, (2011), ISSN: 0160-8371.

Links | BibTeX | Schlagwörter: Current density, Electrical resistance measurement, Fingers, Photovoltaic cells, Resistance, silicon, Surface treatment

2010

C. Mader, J. Müller, S. Gatz, T. Dullweber, and R. Brendel

Rear-side point-contacts by inline thermal evaporation of aluminum Inproceedings

IEEE (Hrsg.): 2010 35th IEEE Photovoltaic Specialists Conference, 001446-001449, Honolulu, HI, USA, (2010), ISSN: 0160-8371.

Links | BibTeX | Schlagwörter: Aluminum, Electrical resistance measurement, Mathematical model, metallization, Photovoltaic cells, silicon, Surface treatment

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