1.
C N Kruse; M Wolf; C Schinke; D Hinken; R Brendel; K Bothe
Impact of contacting geometries on measured fill factors Artikel
In: Energy Procedia, Bd. 124, Nr. Supplement C, S. 84-90, 2017, ISSN: 1876-6102, (7th International Conference on Silicon Photovoltaics, SiliconPV 2017, 3-5 April 2017, Freiburg, Germany).
@article{Kruse2017c,
title = {Impact of contacting geometries on measured fill factors},
author = {C N Kruse and M Wolf and C Schinke and D Hinken and R Brendel and K Bothe},
doi = {10.1016/j.egypro.2017.09.329},
issn = {1876-6102},
year = {2017},
date = {2017-09-21},
journal = {Energy Procedia},
volume = {124},
number = {Supplement C},
pages = {84-90},
abstract = {The fill factor determined from a measured current-voltage characteristic of a bare solar cell depends on the number and positions of the electrical contacting probes. Nine different geometries for contacting the front side busbars are used to measure the current-voltage (I-V) characteristics of a 5 busbar industrial-type passivated emitter and rear totally diffused (PERT) solar cell under standard testing conditions. The fill factors of the measured I-V characteristics vary from 78.5 %abs to 80.6 %abs. We further measure the contacting resistance of 3 different contacting probes to estimate the sensitivity of measurements with different contacting geometries on random resistance variations. The contacting resistance is 60 mΩ for nine-point probes and 80 mΩ for four- and single-point probes. We determine the magnitude of contacting resistance variations from measurements at different probe positions to be ±30 mΩ. Using this variation, we perform numerical simulations and find a larger sensitivity on random resistance variations for tandem- (pairs of current- and sense probes) compared to triplet (one sense- between two current probes) configurations. The corresponding fill factor deviation is approximately 0.1%abs for tandem configurations when the contacting resistances of up to two current probes are altered. The sensitivity for triplet configurations is negligible.},
note = {7th International Conference on Silicon Photovoltaics, SiliconPV 2017, 3-5 April 2017, Freiburg, Germany},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
The fill factor determined from a measured current-voltage characteristic of a bare solar cell depends on the number and positions of the electrical contacting probes. Nine different geometries for contacting the front side busbars are used to measure the current-voltage (I-V) characteristics of a 5 busbar industrial-type passivated emitter and rear totally diffused (PERT) solar cell under standard testing conditions. The fill factors of the measured I-V characteristics vary from 78.5 %abs to 80.6 %abs. We further measure the contacting resistance of 3 different contacting probes to estimate the sensitivity of measurements with different contacting geometries on random resistance variations. The contacting resistance is 60 mΩ for nine-point probes and 80 mΩ for four- and single-point probes. We determine the magnitude of contacting resistance variations from measurements at different probe positions to be ±30 mΩ. Using this variation, we perform numerical simulations and find a larger sensitivity on random resistance variations for tandem- (pairs of current- and sense probes) compared to triplet (one sense- between two current probes) configurations. The corresponding fill factor deviation is approximately 0.1%abs for tandem configurations when the contacting resistances of up to two current probes are altered. The sensitivity for triplet configurations is negligible.