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1.

C Peest; C Schinke; R Brendel; J Schmidt; K Bothe

Instrumentation-related uncertainty of reflectance and transmittance measurements with a two-channel spectrophotometer Artikel

In: Review of Scientific Instruments, Bd. 88, Nr. 1, S. 015105, 2017.

Abstract | Links | BibTeX

2.

C Schinke; P Peest; R Brendel; J Schmidt; K Bothe; M Vogt; I Kröger; S Winter; A Schirmacher; S Lim; H Nguyen; D MacDonald

Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon Artikel

In: AIP Advances, Bd. 5, Nr. 6, S. 067168, 2015.

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3.

C Schinke; K Bothe; P C Peest; J Schmidt; R Brendel

Uncertainty of the coefficient of band-to-band absorption of crystalline silicon at near-infrared wavelengths Artikel

In: Applied Physics Letters, Bd. 104, Nr. 8, S. 081915, 2014.

Links | BibTeX