Measuring material properties

Knowledge and optimization of optical properties is a key aspect of solar cell and PV module development. This applies in particular to the characterization of the different thin layers used in silicon and perovskite solar cells.

Both material properties and interface properties can be investigated with the aid of charge carrier lifetime measurements. We use this to identify defects and investigate passivation mechanisms.

With the measurement methods available at ISFH, you too can have your materials and processes evaluated.