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1.

J Müller; H Hannebauer; C Mader; F Haase; K Bothe

Dynamic infrared lifetime mapping for the measurement of the saturation current density of highly doped regions in silicon Artikel

In: IEEE Journal of Photovoltaics, Bd. 4, Nr. 2, S. 540-548, 2014.

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2.

D Hinken; C Schinke; S Herlufsen; A Schmidt; K Bothe; R Brendel

Experimental setup for camera-based measurements of electrically and optically stimulated luminescence of silicon solar cells and wafers Artikel

In: Review of Scientific Instruments, Bd. 82, Nr. 3, S. 033706, 2011.

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3.

K Ramspeck; K Bothe; J Schmidt; R Brendel

Combined dynamic and steady-state infrared camera based carrier lifetime imaging of silicon wafers Artikel

In: Journal of Applied Physics, Bd. 106, Nr. 11, S. 114506, 2009.

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4.

K Ramspeck; S Reissenweber; J Schmidt; K Bothe; R Brendel

Dynamic carrier lifetime imaging of silicon wafers using an infrared-camera-based approach Artikel

In: Applied Physics Letters, Bd. 93, Nr. 10, S. 102104, 2008.

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5.

D Hinken; K Ramspeck; K Bothe; B Fischer; R Brendel

Series resistance imaging of solar cells by voltage dependent electroluminescence Artikel

In: Applied Physics Letters, Bd. 91, Nr. 18, S. 182104, 2007.

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