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Dynamic photoluminescence lifetime imaging for the characterisation of silicon wafers Artikel
In: physica status solidi (RRL) – Rapid Research Letters, Bd. 5, Nr. 1, S. 25-27, 2011, ISSN: 1862-6270.
Dynamic photoluminescence lifetime imaging for the characterisation of silicon wafers Artikel
In: physica status solidi (RRL) – Rapid Research Letters, Bd. 5, Nr. 1, S. 25-27, 2011, ISSN: 1862-6270.