1.
Y Zhang; C Monokroussos; H Wilterdink; H Müllejans; D Pavanello; M Yoshita; K Yamagoe; K Ramspeck; D Hinken; K Bothe; Y Fujita; G Arnoux; F Pinto; R Ambigapathy; Q Gao; Q Shi; Y F Chen; Y Ping
In: Progress in Photovoltaics: Research and Applications, Bd. 31, Ausg. 3, S. 237-250, 2023.
@article{Zhang2022,
title = {Interlaboratory comparison of voltage sweep methods used for the electrical characterization of encapsulated high-efficiency c-Si solar cells},
author = {Y Zhang and C Monokroussos and H Wilterdink and H Müllejans and D Pavanello and M Yoshita and K Yamagoe and K Ramspeck and D Hinken and K Bothe and Y Fujita and G Arnoux and F Pinto and R Ambigapathy and Q Gao and Q Shi and Y F Chen and Y Ping},
doi = {10.1002/pip.3630},
year = {2023},
date = {2023-03-01},
urldate = {2022-10-24},
journal = {Progress in Photovoltaics: Research and Applications},
volume = {31},
issue = {3},
pages = {237-250},
abstract = {This work presents the comparison of measurement results for four types of encapsulated high-efficiency c-Si solar cells measured by 10 laboratories based in Asia, Europe and North America utilizing a wide range of voltage sweeping methods, which include well-established procedures that represent good industry practice, as well as recently introduced ones that have not been verified yet. The aim of the round-robin interlaboratory comparison was to examine the measurement comparability of different laboratories with respect to their measurement methods of high-efficiency solar cells. A proficiency test was employed to examine the consistency of results and their corresponding uncertainties. The short-circuit current (ISC) under STC measured by four accredited laboratories was firstly compared. In order to investigate the consistency related to the high device capacitance, the value of the ISC was fixed for all 10 participants. The results of all participant laboratories—compared via En number analysis—generally remained well within [−1; 1], thus indicating consistency between the measured values and the reference values within stated measurement uncertainties. The differences remained within ±1.15% in PMAX and within ±0.35% in VOC for all participants and methods applied. Correlations were observed among the PMAX, VOC, and FF differences from their weighted mean. An analysis of the effects of transient current (dQ/dt) at maximum power point caused by hysteresis effect on the measurement error of PMAX showed a significant linear correlation between error of maximum power and junction voltage sweep rate for heterojunction (HJT) solar cells. This work forms the basis to validate all applied methods and their stated measurement uncertainties.},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
This work presents the comparison of measurement results for four types of encapsulated high-efficiency c-Si solar cells measured by 10 laboratories based in Asia, Europe and North America utilizing a wide range of voltage sweeping methods, which include well-established procedures that represent good industry practice, as well as recently introduced ones that have not been verified yet. The aim of the round-robin interlaboratory comparison was to examine the measurement comparability of different laboratories with respect to their measurement methods of high-efficiency solar cells. A proficiency test was employed to examine the consistency of results and their corresponding uncertainties. The short-circuit current (ISC) under STC measured by four accredited laboratories was firstly compared. In order to investigate the consistency related to the high device capacitance, the value of the ISC was fixed for all 10 participants. The results of all participant laboratories—compared via En number analysis—generally remained well within [−1; 1], thus indicating consistency between the measured values and the reference values within stated measurement uncertainties. The differences remained within ±1.15% in PMAX and within ±0.35% in VOC for all participants and methods applied. Correlations were observed among the PMAX, VOC, and FF differences from their weighted mean. An analysis of the effects of transient current (dQ/dt) at maximum power point caused by hysteresis effect on the measurement error of PMAX showed a significant linear correlation between error of maximum power and junction voltage sweep rate for heterojunction (HJT) solar cells. This work forms the basis to validate all applied methods and their stated measurement uncertainties.
2.
C Monokroussos; M Yoshita; K Yamagoe; H Müllejans; D Pavanello; K Ramspeck; D Hinken; K Bothe; Y Fujita; G Arnoux; F Pinto; R Ambigapathy; Q Shi; H Wilterdink; Y Chen; Y Ping; J Q Gao
Interlaboratory Comparison of Voltage Sweep Methods Used for the Electrical Characterization of Encapsulated High-Efficiency c-Si Solar Cells Vortrag
Online Event, 07.09.2021, (38th European Photovoltaic Solar Energy Conference and Exhibition).
@misc{Monokroussos2021,
title = {Interlaboratory Comparison of Voltage Sweep Methods Used for the Electrical Characterization of Encapsulated High-Efficiency c-Si Solar Cells},
author = {C Monokroussos and M Yoshita and K Yamagoe and H Müllejans and D Pavanello and K Ramspeck and D Hinken and K Bothe and Y Fujita and G Arnoux and F Pinto and R Ambigapathy and Q Shi and H Wilterdink and Y Chen and Y Ping and J Q Gao},
year = {2021},
date = {2021-09-07},
address = {Online Event},
abstract = {The power measurements of high efficiency (HE) c-Si technologies have been a challenge for both production lines and calibration laboratories for over two decades due to their slow response causing hysteresis in IV measurements(in particular on pulsed solar simulators) and their substantial spectral mismatch to reference devices (typical of monocrystalline silicon). Recent developmentsin high efficiency (HE) c-Si technologies(such as p-type PERC, n-type PERT, HJT and IBC) made the accuracy of their calibration increasingly important. In parallel advances in measurement systems have opened new possibilities in characterization. In this context a HE encapsulated solar cellround-robin was initiated.},
note = {38th European Photovoltaic Solar Energy Conference and Exhibition},
keywords = {},
pubstate = {published},
tppubtype = {presentation}
}
The power measurements of high efficiency (HE) c-Si technologies have been a challenge for both production lines and calibration laboratories for over two decades due to their slow response causing hysteresis in IV measurements(in particular on pulsed solar simulators) and their substantial spectral mismatch to reference devices (typical of monocrystalline silicon). Recent developmentsin high efficiency (HE) c-Si technologies(such as p-type PERC, n-type PERT, HJT and IBC) made the accuracy of their calibration increasingly important. In parallel advances in measurement systems have opened new possibilities in characterization. In this context a HE encapsulated solar cellround-robin was initiated.
3.
M Bliss; T Betts; R Gottschalg; E Salis; H Müllejans; S Winter; I Kroeger; K Bothe; D Hinken; J Hohl-Ebinger
In: Solar Energy, Bd. 182, S. 256 - 263, 2019, ISSN: 0038-092X.
@article{Bliss2019b,
title = {Interlaboratory comparison of short-circuit current versus irradiance linearity measurements of photovoltaic devices},
author = {M Bliss and T Betts and R Gottschalg and E Salis and H Müllejans and S Winter and I Kroeger and K Bothe and D Hinken and J Hohl-Ebinger},
doi = {10.1016/j.solener.2019.02.031},
issn = {0038-092X},
year = {2019},
date = {2019-04-01},
journal = {Solar Energy},
volume = {182},
pages = {256 - 263},
abstract = {This work presents the results of the first interlaboratory comparison of linearity measurements of short-circuit current versus irradiance that includes a wide variety of photovoltaic (PV) device types, from reference cells to full-size modules. The aim of this inter-comparison was to compare the methods employed and to collect new inputs useful for the revision of the standard IEC 60904-10, which deals with linearity measurements for PV devices. The procedures and facilities employed by the partners include the differential spectral responsivity, the white light response, the solar simulator method and the two-lamp method. The facilities are generically described and compared and their main sources of uncertainty are discussed. Comparison results show good agreement within declared uncertainties between all partners. A few minor exceptions under low-light conditions raise questions of possible uncertainty underestimation for these specific conditions. The overall outcome of the comparison also highlights the importance of considering correlations in the uncertainty budget, which can potentially improve the overall stated uncertainty. A critical review is made of the data analysis adopted in the standard IEC 60904-10 to calculate the linearity degree of the short-circuit current towards irradiance. The analysis review suggests a way to make results based on different methods more comparable and less prone to erroneous linearity assessment.},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
This work presents the results of the first interlaboratory comparison of linearity measurements of short-circuit current versus irradiance that includes a wide variety of photovoltaic (PV) device types, from reference cells to full-size modules. The aim of this inter-comparison was to compare the methods employed and to collect new inputs useful for the revision of the standard IEC 60904-10, which deals with linearity measurements for PV devices. The procedures and facilities employed by the partners include the differential spectral responsivity, the white light response, the solar simulator method and the two-lamp method. The facilities are generically described and compared and their main sources of uncertainty are discussed. Comparison results show good agreement within declared uncertainties between all partners. A few minor exceptions under low-light conditions raise questions of possible uncertainty underestimation for these specific conditions. The overall outcome of the comparison also highlights the importance of considering correlations in the uncertainty budget, which can potentially improve the overall stated uncertainty. A critical review is made of the data analysis adopted in the standard IEC 60904-10 to calculate the linearity degree of the short-circuit current towards irradiance. The analysis review suggests a way to make results based on different methods more comparable and less prone to erroneous linearity assessment.