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C Gemmel; J Hensen; S Kajari-Schröder; R Brendel

Lifetime Analysis for Defect Characterization in Kerfless Epitaxial Silicon from the Porous Silicon Process Artikel

In: Energy Procedia, Bd. 92, S. 29-36, 2016, ISSN: 1876-6102, (Proceedings of the 6th International Conference on Crystalline Silicon Photovoltaics (SiliconPV 2016)).

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