Hail damage to photovoltaic modules is difficult to detect and difficult to prove. “FLOIS” is a new, multi-award-winning analytical method developed by the Institute for Solar Energy Research (ISFH) in Hamelin.
It is a device developed by ISFH that can be used in free-field PV systems to inspect up to 200 modules per hour to detect microcracks, much faster than other methods. This process has been awarded the “pv magazine award” in the category “Top Innovation” by “pv-magazin”.
This method not only allows damage to be localized, but also to determine the age of the damage.